Three Measurement Modes: Free switching between white light interference, infinite zoom, and film thickness modes.
Ultra-High Precision: Vertical resolution up to 0.1nm with measurement accuracy of 1nm.
Non-Contact Measurement: Safe, non-destructive measurement for samples ranging from 1nm to 10mm height.
Customizable Functions: Supports custom functions like sample heating and secondary development interfaces.
ISO Standard Compliance: Provides parameters compliant with ISO25178 and ISO 4287 international standards.
Wide Application Scope: Ideal for semiconductor, PCB, micro-nano manufacturing, and optical machining.
Real-Time Data Integration: Real-time acquisition with reserved network ports for MES system integration.
OEM/ODM Services: Full customization available from designs with dedicated R&D engineers.