5MP Ultra-High Resolution 2560X2048 Ingaas 3.45um Tec Cooled for Semiconductor & Scientific Imaging Vis-Swir Camera

The ED-SW5000-3.45T features a groundbreaking 2560*2048 resolution with a 3.45um pixel pitch. This microscopic precision allows you to inspect much finer defects in semiconductor wafers, or capture vastly more detail at extreme distances for long-range optoelectronic payloads, which standard resolution cameras cannot achieve

No, it is a broad-spectrum Vis-SWIR camera. It has exceptionally high sensitivity in the 0.4um to 1.7um spectral band. This means a single camera core can achieve both visible and invisible light imaging, making it perfect for daytime to low-light imaging and penetrating fog, haze, and dust.

Yes. While it outputs 35.5fps at the full 2560*2048 resolution (12Bit), the camera supports Windowing mode to further increase frame rates. Depending on your selected ROI (Region of Interest), it can achieve 25Hz, 50Hz, 100Hz, 130Hz, and beyond.

We ensure seamless integration for developers. The camera supports USB3Vision, GenICam, and UDP protocols. It provides multiple digital output options including CameraLink, SDI, USB3.0, and GigE. Furthermore, it is fully compatible with mainstream environments like OpenCV, LabView, Matlab, C/C++, C#, and QT.

The camera utilizes precise TEC Thermoelectric Cooling temperature control capable of maintaining a cooling temperature difference of T under 25 degrees C at room temperature. This significantly reduces readout noise to under 210e and ensures a high dynamic range of 58.7 dB, providing the pure image data required for scientific research and medical imaging.