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Spectroscopic Ellipsometer Spectral Ellipsometry Thin Film Thickness Analyzer Nanofilm Thickness Tester
US$1,500.00-3,500.00
1 Piece
Product profile
Customization
AvailableAfter-sales Service
OnlineWarranty
1 YearModel NO.
LR-ES01FType
Testing MachineAccuracy Grade
1Load Way
Electronic LoadLoading Method
Dynamic LoadDisplay
DigitalControl
Computer ControlWeight
0-100KgPower Source
AC220VTransport Package
Plywood CasesTrademark
LONROYOrigin
ChinaHS Code
9024800000Production Capacity
200 Units Per MonthKey features
Atomic-Layer Sensitivity: Capable of measuring single atomic layers with high precision.
Full Mueller Matrix Measurement: Measures all 12 elements of the Mueller matrix eliminating depolarization effects.
Wide Spectral Range: Covers 245-1000 nm with custom spectral ranges available upon request.
High Long-Term Accuracy: Guaranteed accuracy using rapid compensator rotation and super-achromatic compensators.
One-Click Operation: Simplified operation with single mouse click for complex measurement and analysis.
Multi-Incident Angle Support: Enhances flexibility for measuring ultra-thin or complex samples.
Comprehensive Software: Features wizard-driven design, material database, and multiple dispersion models.
Video-Based Alignment: Precise sample alignment with electronic video image support to reduce human error.
Company profile
Business Type: Manufacturer/Factory, Trading CompanyExport Year: 2016-03-01Nearest Port: ShenzhenAverage Response Time: ≤8.57hTerms of Payment: LC, T/T, D/P, etc.International Commercial Terms(Incoterms): FCA, FOB, EXW, CFR, CIF, DAT, FAS, DDP, DAP, CIP, CPT, Others
AI-Powered supplier vetting
SummaryThe supplier is a limited trading company with three employees, valid import and export licensing, and a product portfolio covering testing instruments and meters. Its stated quality assurance is positive, and RoHS is identified as a sustainability/product certification. However, the supplier has no documented procedures or records for corrective and preventive actions, complaint handling, or supplier-service assessment. Overseas service coverage is limited: it has no overseas showroom, agents, branches, or offline trade-show experience. The supplier reports no new products in the past year, no ODM, OEM, or SDK capability, and no stated production capability. Financial information is inconsistent across the provided records, with some years showing zero operating and profitability indicators; therefore, financial credibility cannot be confirmed. No customer cases are provided.
Supplier typeThe supplier is explicitly identified as a trading company and a limited company, with three employees and no stated affiliation with a larger group. It also holds a valid import and export license, indicating an established trading role rather than a confirmed manufacturing role.
CertificationsThe supplier states that it has quality assurance in its quality-control processes and identifies RoHS under sustainable development and product certification capability. The slices do not provide certificate numbers, issuing bodies, validity periods, or additional certifications.
After-Sales capabilityAfter-sales service infrastructure is weakly documented: there are no written procedures or records for complaint handling, corrective and preventive actions, or effective service-capability assessment. The supplier also has no overseas showroom, agents, branches, or offline trade-show experience, although it states lead times within 15 working days and accepts several quotation and payment terms.
R&D capabilityThe supplier reports no new products during the past year, no available SDK, and no ODM service. These statements indicate limited documented innovation and product-development capability.
Customization capabilityThe supplier explicitly reports that it does not provide ODM services and does not provide OEM services for popular brands. No other customization capability is documented.
Product Q&A
Q:What is the spectral range of the instrument?
A:
The standard spectral range is 245-1000 nm, but custom spectral ranges are available upon request.
Q:Can the instrument measure single atomic layers?
A:
Yes, it features atomic-layer level detection sensitivity capable of measuring single atomic layers.
Q:What is the measurement repeatability for a standard sample?
A:
For a 100 nm SiO2 film on Si standard wafer, thickness repeatability is 0.005 nm and refractive index repeatability is 0.0002.
Q:Is the software interface available in languages other than English?
A:
Yes, the software supports multilingual interfaces including Chinese and English, with Chinese as the default.
Q:What is the typical measurement time per sample?
A:
The typical measurement time is between 1 to 2 seconds.
Send Inquiry
*To:
Dongguan Lonroy Equipment Co., Ltd
Dongguan Lonroy Equipment Co., Ltd*Content:
Supplier replies will be sent to your registered email
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