Multi-Element Analysis: Analyzes up to 40 distinct elements simultaneously for comprehensive results.
High Precision Detector: Equipped with Peltier-cooled Super FAST SDD silicon drift detector for high resolution.
Patented Technology: Features multi-collimator, multi-filter, and background subtraction for unrivaled accuracy.
Wide Application Range: Suitable for iron, copper, chromium, molybdenum, tungsten, lead-zinc, and nickel ores.
Customizable Options: Detector, X-ray source, and measurement content range are fully customizable.
Stable Vacuum System: Integrated dual vacuum pumping mechanisms with automatic vacuum stabilization.
Light Element Detection: Patented thin-film filter technology significantly enhances detection limits for light elements.
User-Friendly Software: Standard basic parameter method software supports multi-tasking and multi-window operation.