Rapid Non-Destructive Analysis: Delivers results in 1-3 minutes with minimal or no sample preparation required.
Wide Material Compatibility: Analyzes ores, soil, plastics, petrochemicals, food, and pharmaceuticals.
Advanced SDD Detector: Features 50 kV X-ray tube and electrically cooled Silicon Drift Detector.
Multi-Element Capability: Simultaneous analysis of elemental and oxide composition from Na to U.
Customizable Configuration: Detector, X-ray source, and measurement range are fully customizable.
FP Software Precision: Windows-based software minimizes matrix effects for enhanced accuracy.
Built-in HD Camera: Provides crystal-clear sample visualization for improved operational precision.
8 Optical Path Systems: Automatic switching tailored for various sample sizes to minimize errors.